Properties of Interface Structures Based on Oxidized Lead Selenide - PDF (Russian)
Copyright (c) 2025 Russian Academy of Sciences
Copyright (c) 2025 Russian Academy of Sciences
ISSN 1028-0960 (Print)
ISSN 3034-5731 (Online)
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Keywords
X-ray diffraction
X-ray phase analysis
X-ray photoelectron spectroscopy
atomic force microscopy
electron microscopy
ion implantation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
phase composition
scanning electron microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
transmission electron microscopy
zinc oxide
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Keywords
X-ray diffraction
X-ray phase analysis
X-ray photoelectron spectroscopy
atomic force microscopy
electron microscopy
ion implantation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
phase composition
scanning electron microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
transmission electron microscopy
zinc oxide
Copyright (c) 2025 Russian Academy of Sciences